Surface segregation and interdiffusion of Ge on Si(001) studied by medium-energy ion scattering

Author: Sumitomo K.   Shiraishi K.   Kobayashi Y.   Ito  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.369, Iss.1, 2000-07, pp. : 112-115

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Abstract