Low temperature atomic layer growth of aluminum nitride on Si(100) using dimethylethylamine alane and 1,1-dimethylhydrazine

Author: Robinson D.W.   Rogers Jr. J.W.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.372, Iss.1, 2000-09, pp. : 10-24

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Abstract