The optical and structural properties of AlN thin films characterized by spectroscopic ellipsometry

By Joo H.Y.   Kim H.J.   Kim S.J.   Kim S.Y.  

Thin Solid Films, Vol. 368, Iss. 1, 2000-06 ,pp. : 67-73

Elsevier

Access to resources Recommend Favorite

Characterizations of SnO 2 thin films deposited on Si substrates

By Yan H.   Chen G.H.   Man W.K.   Wong S.P.   Kwok R.W.M.  

Thin Solid Films, Vol. 326, Iss. 1, 1998-08 ,pp. : 88-91

Elsevier

Access to resources Recommend Favorite

Structural and morphological characterizations of ZnO films grown on GaAs substrates by MOCVD

By Agouram S.   Zuñiga Perez J.   Muñoz-Sanjosé V.  

Applied Physics A, Vol. 88, Iss. 1, 2007-07 ,pp. : 83-87

Springer Publishing Company

Access to resources Recommend Favorite

Optical spectroscopic characterization of plasma-polymerized thin films

By Lee K.   Chang Y.   Kim J.Y.  

Thin Solid Films, Vol. 423, Iss. 2, 2003-01 ,pp. : 131-135

Elsevier

Access to resources Recommend Favorite

Structural and spectroscopic characterization of Cu(II) [tetrakis-(3,3-dimethyl-1-butoxycarbonyl)] phthalocyanine thin films deposited by the Langmuir-Blodgett technique

By Pasimeni L.   Meneghetti M.   Rella R.   Granito C.   Troisi L.  

Thin Solid Films, Vol. 265, Iss. 1, 1995-09 ,pp. : 58-65

Elsevier

Access to resources Recommend Favorite