Effect of stress on interface transformation in thin semiconducting layers

Author： Bak-Misiuk J.   Domagala J.   Misiuk A.   Sadowski J.   Zytkiewicz Z.R.   Trela J.   Antonova I.V.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.380, Iss.1, 2000-12, pp. : 117-119

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