Grain boundary trap passivation in polysilicon thin film transistor investigated by low frequency noise

Author: Mercha A.   Pichon L.   Carin R.   Mourgues K.   Bonnaud O.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.383, Iss.1, 2001-02, pp. : 303-306

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Abstract