The effect of a migration barrier between tungsten oxide and indium tin oxide thin films in electrochromic devices

Author： Huh J.S. Hwang H.R. Paik J.H. Lee D.D. Lim J.O.

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.385, Iss.1, 2001-04, pp. : 255-259

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