Micro-scratch test study of TiN films grown on silicon by chemical vapor deposition

Author: Benayoun S.   Hantzpergue J.J.   Bouteville A.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.389, Iss.1, 2001-06, pp. : 187-193

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Abstract