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Elsevier

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Structure of polycrystalline silicon films deposited at low temperature by plasma CVD on substrates exposed to different plasma

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Texture and grain structure in polycrystalline silver films deposited by partially ionised beam

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Correlation between texture and average grain size in polycrystalline Ag thin films

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Dry lithiation study of nanocrystalline, polycrystalline and amorphous tungsten trioxide thin-films

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