Transmission electron microscopy study of silicon nitride amorphous films obtained by reactive pulsed laser deposition

Author: Teodorescu V.S.   Nistor L.C.   Popescu M.   Mihailescu I.N.   Gyorgy E.   Van Landuyt J.   Perrone A.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.397, Iss.1, 2001-10, pp. : 12-16

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Abstract