RBS and XHRTEM characterization of epitaxial Ni films prepared by biased d.c. sputter deposition on MgO(001)

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Elsevier

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Phase composition and microstructure of polycrystalline and epitaxial TaN x layers grown on oxidized Si(001) and MgO(001) by reactive magnetron sputter deposition

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Thin Solid Films, Vol. 402, Iss. 1, 2002-01 ,pp. : 172-182

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FMR, XRD and XHRTEM characterization of stresses in an epitaxial Ni-Cu film prepared on MgO(001) by d.c. biased plasma sputter deposition

By Maruyama H.   Qiu H.   Hashimoto M.   Fudaba K.   Nakai H.   Barna A.   Barna P.B.  

Thin Solid Films, Vol. 299, Iss. 1, 1997-05 ,pp. : 59-62

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Ab initio density functional simulation of structural and electronic properties of MgO ultra-thin adlayers on the (001) Ag surface

By Sgroi M.   Pisani C.   Busso M.  

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Structural and electrical properties of Ni-Cu films deposited onto MgO(001) by d.c. biased plasma sputter deposition

By Hashimoto M.   Qui H.   Barna A.   Barna P.B.  

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