Structural and optical characterization of nanocrystals of the InAs-InP system embedded in amorphous SiO 2 thin films

Author： Zheng M.J.   Zhang L.D.   Yang L.   Li G.H.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.401, Iss.1, 2001-12, pp. : 145-149

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