Study of structural and optical properties of nanocrystalline silicon embedded in SiO 2

Author: Yun F.   Hinds B.J.   Hatatani S.   Oda S.   Zhao Q.X.   Willander M.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.375, Iss.1, 2000-10, pp. : 137-141

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Abstract