Phase modulated spectroscopic ellipsometry of dielectric multilayer beam combiner

Author: Bhattacharyya D.   Sahoo N.K.   Thakur S.   Das N.C.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.416, Iss.1, 2002-09, pp. : 97-105

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract