Spectroscopic ellipsometry of TiO 2 layers prepared by ion-assisted electron-beam evaporation

Author: Bhattacharyya D.   Sahoo N.K.   Thakur S.   Das N.C.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.360, Iss.1, 2000-02, pp. : 96-102

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Abstract