Time-of-flight measurements of carrier drift mobilities in polymorphous silicon

Author: Brinza M.   Adriaenssens G.J.   Cabarrocas P.R.i.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.427, Iss.1, 2003-03, pp. : 123-126

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