Bias controlled spectral sensitivity in a-SiC:H p-i-n devices

Author： Louro P.   Vieira M.   Fantoni A.   Fernandes M.   Vygranenko Y.   Schwarz R.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.427, Iss.1, 2003-03, pp. : 196-200

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