Formation of low-resistivity poly-Si and SiN x films by Cat-CVD for ULSI application

Author: Morimoto R.   Yokomori C.   Kikkawa A.   Izumi A.   Matsumura H.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.430, Iss.1, 2003-04, pp. : 230-235

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Abstract