Real-time stress/strain measurement during growth of Sr and SrO epilayer on H-terminated Si

Author： Asaoka H.   Machida Y.   Yamamoto H.   Hojou K.   Saiki K.   Koma A.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.433, Iss.1, 2003-06, pp. : 140-143

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