Valence band offset at silicon/silicon nitride and silicon nitride/silicon oxide interfaces

Author： Gritsenko V.A.   Shaposhnikov A.V.   Kwok W.M.   Wong H.   Jidomirov G.M.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.437, Iss.1, 2003-08, pp. : 135-139

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