Helical-type surface defects in InGaN thin films epitaxially grown on GaN templates at reduced temperatures

Author： Miraglia P.Q.   Preble E.A.   Roskowski A.M.   Einfeldt S.   Lim S.H.   Liliental-Weber Z.   Davis R.F.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.437, Iss.1, 2003-08, pp. : 140-149

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