Author: Hausmann D.M. de Rouffignac P. Smith A. Gordon R. Monsma D.
Publisher: Elsevier
ISSN: 0040-6090
Source: Thin Solid Films, Vol.443, Iss.1, 2003-10, pp. : 1-4
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Properties of tantalum oxide thin films grown by atomic layer deposition
By Kukli K. Aarik J. Aidla A. Kohan O. Uustare T. Sammelselg V.
Thin Solid Films, Vol. 260, Iss. 2, 1995-05 ,pp. :
Atomic layer deposition (ALD): from precursors to thin film structures
Thin Solid Films, Vol. 409, Iss. 1, 2002-04 ,pp. :
Reduction of droplet of tantalum oxide using double slit in pulsed laser deposition
By Hino T. Mustofa S. Nishida M. Araki T.
Vacuum, Vol. 70, Iss. 1, 2003-02 ,pp. :