![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Author: Jirsak T. Nikolajenko V.
Publisher: Elsevier
ISSN: 0042-207X
Source: Vacuum, Vol.47, Iss.2, 1996-02, pp. : 173-176
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
By Leclerc Arnaud Larachi Faical
Composite Interfaces, Vol. 39, Iss. 2, 2011-03 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Spatial mapping in the electron-impact ion-source of a residual gas analyser
By Holst B. Buckland J.R. Allison W.
Vacuum, Vol. 53, Iss. 1, 1999-05 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
The influence of a hot cathode vacuum gauge on the residual gas composition
By Nemanic V. Zumer M. Zajec B.
Vacuum, Vol. 70, Iss. 4, 2003-04 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Moisture analyser for UHP gas systems
World Pumps, Vol. 2002, Iss. 425, 2002-02 ,pp. :