Influence of surface carbon on the formation of silicon-refractory metal interfaces

By Gall N.R.   Rut'kov E.V.   Tontegode A.Y.  

Thin Solid Films, Vol. 266, Iss. 2, 1995-10 ,pp. : 229-233

Elsevier

Access to resources Recommend Favorite

Metal oxide/silicon oxide multilayer with smooth interfaces produced by in situ controlled plasma-enhanced MOCVD

By Hamelmann F.   Haindl G.   Schmalhorst J.   Aschentrup A.   Majkova E.   Kleineberg U.   Heinzmann U.   Klipp A.   Jutzi P.   Anopchenko A.   Jergel M.   Luby S.  

Thin Solid Films, Vol. 358, Iss. 1, 2000-01 ,pp. : 90-93

Elsevier

Access to resources Recommend Favorite

Electrical characterization of metal Schottky contacts on luminescent porous silicon

By Diligenti A.   Nannini A.   Pennelli G.   Pellegrini V.   Fuso F.   Allegrini M.  

Thin Solid Films, Vol. 276, Iss. 1, 1996-04 ,pp. : 179-182

Elsevier

Access to resources Recommend Favorite

Photoluminescence characterization of non-radiative defect density on silicon surfaces and interfaces at room temperature

By Timoshenko V.Y.   Petrenko A.B.   Dittrich T.   Fussel W.   Rappich J.  

Thin Solid Films, Vol. 364, Iss. 1, 2000-03 ,pp. : 196-199

Elsevier

Access to resources Recommend Favorite

Interfaces in metal matrix composites

By Chawla K.K.  

Composite Interfaces, Vol. 4, Iss. 5, 1996-01 ,pp. : 287-298

Taylor & Francis Ltd

Access to resources Recommend Favorite