Characterization of TiN films prepared by rf sputtering using metal and compound targets

Author: Kawamura M.   Kumagai K.   Abe Y.   Sasaki K.   Yanagisawa H.  

Publisher: Elsevier

ISSN: 0042-207X

Source: Vacuum, Vol.51, Iss.3, 1998-11, pp. : 377-380

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Abstract