A new technique for monitoring the microscopic electronic surface structures of sputtered thin films

Author: Obara K.   Yiji P.   Suemoto Y.   Ogushi T.   Moller W.  

Publisher: Elsevier

ISSN: 0042-207X

Source: Vacuum, Vol.51, Iss.4, 1998-12, pp. : 491-496

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Abstract