Author： Slowko W.
Publisher： Elsevier
ISSN： 0042-207X
Source： Vacuum, Vol.52, Iss.4, 1999-04, pp. : 441-449
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Detection of secondary electrons in a retarding electric field
Vacuum, Vol. 63, Iss. 4, 2001-08 ,pp. :
Access to resources
Recommend
Measurement & simulation of backscattered electrons from a strip electron beam source
By Sahu G.K. Tamhankar R.V. Thakur K.B.
Vacuum, Vol. 62, Iss. 4, 2001-06 ,pp. :
Study of secondary electron emission from various targets due to 100 MeV Si 7+ beam
By Chauhan R.S. Mittal V.K. Nandi T.K. Mandal A. Avasthi D.K.
Vacuum, Vol. 48, Iss. 12, 1997-12 ,pp. :