Author： Sahu G.K. Tamhankar R.V. Thakur K.B.
Publisher： Elsevier
ISSN： 0042-207X
Source： Vacuum, Vol.62, Iss.4, 2001-06, pp. : 367-378
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Spectral density of elastically backscattered electrons from polycrystalline titanium
By Grzeszczak A. Kaszczyszyn S. Klein S.
Vacuum, Vol. 55, Iss. 1, 1999-10 ,pp. :
Access to resources
Recommend
Electrons elastically backscattered from Al, Ag and Au samples
By Gruzza B. Robert C. Peuchot B. Bideux L.
Vacuum, Vol. 50, Iss. 1, 1998-05 ,pp. :
Directional detection of secondary electrons for electron beam profilography
By Slowko W.
Vacuum, Vol. 52, Iss. 4, 1999-04 ,pp. :
Systematical error of the measurement of electron beam emittance
Vacuum, Vol. 51, Iss. 2, 1998-10 ,pp. :