Demixing in spin valve structures: an Auger depth profiling study

By Menyhard M.   Sulyok A.   Pentek K.   Zeltser A.M.  

Thin Solid Films, Vol. 366, Iss. 1, 2000-05 ,pp. : 129-134

Elsevier

Access to resources Recommend Favorite

Modelling of surface topography development during ion sputtering of solids

By Birkgan S. E.   Bachurin V. I.   Rudy A. S.   Smirnov V. K.  

Radiation Effects and Defects in Solids, Vol. 159, Iss. 3, 2004-03 ,pp. : 163-172

Taylor & Francis Ltd

Access to resources Recommend Favorite

AES depth profiling of thermally treated Al/Si thin-film structures

By Zalar A.   Wang J.Y.   Zhao Y.H.   Mittemeijer E.J.   Panjan P.  

Vacuum, Vol. 71, Iss. 1, 2003-05 ,pp. : 11-17

Elsevier

Access to resources Recommend Favorite

Quantitative X-ray diffraction analysis of surface layers by computed depth profiling

By Luo J.   Tao K.  

Thin Solid Films, Vol. 279, Iss. 1, 1996-06 ,pp. : 53-58

Elsevier

Access to resources Recommend Favorite

Depth profiling studies of the surface directed phase decomposition in thin polymer films

By Rysz J.   Ermer H.   Budkowski A.   Lekka M.   Bernasik A.   Wrobel S.   Brenn R.   Lekki J.   Jedlinski J.  

Vacuum, Vol. 54, Iss. 1, 1999-07 ,pp. : 303-307

Elsevier

Access to resources Recommend Favorite