Effects of oxygen ion beam plasma conditions on the properties of Indium tin oxide thin films

Author: Bae J.W.   Kim H.J.   Kim J.S.   Lee N.E.   Yeom G.Y.  

Publisher: Elsevier

ISSN: 0042-207X

Source: Vacuum, Vol.56, Iss.1, 2000-01, pp. : 77-81

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Abstract