Physico-chemical characterization of -In 2 S 3 thin films synthesized by solid-state reaction, induced by annealing, of the constituents sequentially deposited in thin layers

Author： Barreau N.   Marsillac S.   Bernede J.C.  

Publisher： Elsevier

ISSN： 0042-207X

Source： Vacuum, Vol.56, Iss.2, 2000-02, pp. : 101-106

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