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Elsevier

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Structural analysis of chalcogenide waveguides using Rutherford backscattering spectroscopy

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Near-surface compositional oscillations of Co diffused into Si(100) at -60 °C: a study by high-resolution Rutherford backscattering

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Diffusion of Pd in alpha-Ti studied by means of Rutherford back-scattering and channelling techniques

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Effects of ion beam bombardment on electrochromic tungsten oxide films studied by X-ray photoelectron spectroscopy and Rutherford back-scattering

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