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Philosophical Magazine, Vol. 83, Iss. 8, 2003-03 ,pp. : 1033-1044

Taylor & Francis Ltd

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Influence of residual stresses on the mechanical properties of TiC x N 1-x (x=0, 0.15, 0.45) thin films deposited by arc evaporation

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Measurements of residual stresses in thin films using micro-rotating-structures

By Zhang X.   Zhang T.-Y.   Zohar Y.  

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Kinetic model of vapour-deposited thin film condensation: Stage of liquid-like coalescence

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Surface studies of chemically vapour-deposited silicon films using friction force microscopy

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