Wettability and surface forces measured by atomic force microscopy: the role of roughness

Author： Gavoille J. Takadoum J. Martin N. Durand D.

E-ISSN： 1286-0050|48|1|10504-10504

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.48, Iss.1, 2009-07, pp. : 10504-10504

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