Structure of planar defects in (Sr 0.9 Ca 0.3 ) 1.1 CuO 2 infinite-layer superconductors by quantitative high-resolution electron microscopy

Author： Zhang H.   Marks L.D.   Wang Y.Y.   Zhang H.   Dravid V.P.   Han P.   Payne D.A.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.57, Iss.1, 1995-01, pp. : 103-111

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