Synthesis of analytical and high-resolution transmission electron microscopy to determine the interface structure of Cu/Al 2 O 3

Author： Dehm G.   Scheu C.   Mobus G.   Brydson R.   Ruhle M.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.67, Iss.1, 1997-06, pp. : 207-217

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