Author: Ishikawa T. Wakabayashi T.
Publisher: Elsevier
ISSN: 0304-3991
Source: Ultramicroscopy, Vol.57, Iss.1, 1995-01, pp. : 91-101
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
By Inoue M. Suzuki K. Amasuga H. Nakamura M. Mera Y. Takeuchi S. Maeda K.
Ultramicroscopy, Vol. 75, Iss. 1, 1998-10 ,pp. :
A robust algorithm for the reconstruction of helical filaments using single-particle methods
By Egelman E.H.
Ultramicroscopy, Vol. 85, Iss. 4, 2000-12 ,pp. :
A new phase consistency criterion and its application in electron crystallography
By He W. Carazo J.-M. Fernandez J.-J.
Ultramicroscopy, Vol. 85, Iss. 2, 2000-10 ,pp. :
A proposal for dichroic experiments in the electron microscope
By Hebert C. Schattschneider P.
Ultramicroscopy, Vol. 96, Iss. 3, 2003-09 ,pp. :