Author: Egelman E.H.
Publisher: Elsevier
ISSN: 0304-3991
Source: Ultramicroscopy, Vol.85, Iss.4, 2000-12, pp. : 225-234
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Particle finding in electron micrographs using a fast local correlation algorithm
By Roseman A.M.
Ultramicroscopy, Vol. 94, Iss. 3, 2003-04 ,pp. :
PHOELIX: a package for semi-automated helical reconstruction
By Whittaker M. Carragher B.O. Milligan R.A.
Ultramicroscopy, Vol. 58, Iss. 3, 1995-06 ,pp. :