Weak beam under convergent beam illumination

By Schaublin R.   Meng X.   Stobbs W.M.  

Ultramicroscopy, Vol. 83, Iss. 3, 2000-06 ,pp. : 145-157

Elsevier

Access to resources Recommend Favorite

Towards atomic resolution EELS of anisotropic materials

By Menon N.K.   Yuan J.  

Ultramicroscopy, Vol. 78, Iss. 1, 1999-06 ,pp. : 185-205

Elsevier

Access to resources Recommend Favorite

Structure determination at the atomic level from dynamical electron diffraction data under systematic row conditions

By Allen L.J.   Oxley M.P.  

Ultramicroscopy, Vol. 88, Iss. 3, 2001-08 ,pp. : 195-209

Elsevier

Access to resources Recommend Favorite

Reduced density function analysis using convergent electron illumination and iterative blind deconvolution

By McBride W.E.   Cockayne D.J.H.   Goringe C.M.  

Ultramicroscopy, Vol. 76, Iss. 3, 1999-01 ,pp. : 115-123

Elsevier

Access to resources Recommend Favorite

Optimum condition of convergent beam illumination for observation of local structure by high resolution transmission electron microscopy

By Mitome M.   Takayanagi K.  

Ultramicroscopy, Vol. 62, Iss. 1, 1996-01 ,pp. : 123-131

Elsevier

Access to resources Recommend Favorite