Reduced density function analysis using convergent electron illumination and iterative blind deconvolution

Author： McBride W.E.   Cockayne D.J.H.   Goringe C.M.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.76, Iss.3, 1999-01, pp. : 115-123

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Deconvolution of electron diffraction patterns of amorphous materials formed with convergent beam

By McBride W.   Cockayne D.J.H.   Tsuda K.  

Ultramicroscopy, Vol. 94, Iss. 3, 2003-04 ,pp. : 305-308

Elsevier

Access to resources Recommend Favorite

Optimum condition of convergent beam illumination for observation of local structure by high resolution transmission electron microscopy

By Mitome M.   Takayanagi K.  

Ultramicroscopy, Vol. 62, Iss. 1, 1996-01 ,pp. : 123-131

Elsevier

Access to resources Recommend Favorite

Analysis of grain boundary dislocations by large angle convergent beam electron diffraction

By Morniroli J.P.   Cherns D.  

Ultramicroscopy, Vol. 62, Iss. 1, 1996-01 ,pp. : 53-63

Elsevier

Access to resources Recommend Favorite

Weak beam under convergent beam illumination

By Schaublin R.   Meng X.   Stobbs W.M.  

Ultramicroscopy, Vol. 83, Iss. 3, 2000-06 ,pp. : 145-157

Elsevier

Access to resources Recommend Favorite

Interferometry using convergent electron diffracted beams plus an electron biprism (CBED + EBI)

By Herring R.A.   Pozzi G.   Tanji T.   Tonomura A.  

Ultramicroscopy, Vol. 60, Iss. 1, 1995-08 ,pp. : 153-169

Elsevier

Access to resources Recommend Favorite