Interferometry using convergent electron diffracted beams plus an electron biprism (CBED + EBI)

Author: Herring R.A.   Pozzi G.   Tanji T.   Tonomura A.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.60, Iss.1, 1995-08, pp. : 153-169

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Abstract