Multi-detection and polarisation contrast in scanning near-field optical microscopy in reflection

Author： Jalocha A.   Moers M.H.P.   Ruiter A.G.T.   van Hulst N.F.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.61, Iss.1, 1995-12, pp. : 221-226

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