Nanoscale photoluminescence mapping for MOVPE InN films using scanning near-field optical microscopy (SNOM)

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Science and Technology of Advanced Materials, Vol. 7, Iss. 3, 2006-04 ,pp. : 54-57

IOP Publishing

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Polarization effect in scanning near-field optic/atomic-force microscopy (SNOM/AFM)

By Nakajima K.   Mitsuoka Y.   Chiba N.   Muramatsu H.   Ataka T.   Sato K.   Fujihira M.  

Ultramicroscopy, Vol. 71, Iss. 1, 1998-03 ,pp. : 257-262

Elsevier

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Multi-detection and polarisation contrast in scanning near-field optical microscopy in reflection

By Jalocha A.   Moers M.H.P.   Ruiter A.G.T.   van Hulst N.F.  

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Scanning near-field optical microscopy of fluorescent polystyrene spheres with a combined SNOM and AFM

By Fujihira M.   Monobe H.   Yamamoto N.   Muramatsu H.   Chiba N.   Nakajima K.   Ataka T.  

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Reflection scanning near-field optical microscopy (R-SNOM) in constant height mode with a dielectric probe Image interpretation and resolution for high topographic variations

By Barchiesi D.   Bergossi O.   Pieralli C.   Spajer M.  

Ultramicroscopy, Vol. 71, Iss. 1, 1998-03 ,pp. : 361-370

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