Use of reciprocal lattice layer spacing in electron backscatter diffraction pattern analysis

By Michael J.R.   Eades J.A.  

Ultramicroscopy, Vol. 81, Iss. 2, 2000-03 ,pp. : 67-81

Elsevier

Access to resources Recommend Favorite

Measurement of three-dimensional intensity data in electron diffraction by the precession technique

By Berg B.S.   Hansen V.   Midgley P.A.   Gjonnes J.  

Ultramicroscopy, Vol. 74, Iss. 3, 1998-08 ,pp. : 147-157

Elsevier

Access to resources Recommend Favorite

Dynamical electron diffraction analysis of lattice parameters, Debye-Waller factors and order in Ti-Al and Ti-Ga alloys

By Rossouw C.J.   Gibson M.A.   Forwood C.T.  

Ultramicroscopy, Vol. 66, Iss. 3, 1996-12 ,pp. : 193-209

Elsevier

Access to resources Recommend Favorite

Assessment of the quantitative characterization of localized strain using electron diffraction contrast imaging

By Janssens K.G.F.   Van der Biest O.   Vanhellemont J.   Maes H.E.  

Ultramicroscopy, Vol. 69, Iss. 3, 1997-10 ,pp. : 151-167

Elsevier

Access to resources Recommend Favorite

Quantitative measurement of displacement and strain fields from HREM micrographs - Electron Diffraction Effects due to Modulated Structures

By Hytch M.J.   Snoeck E.   Kilaas R.  

Ultramicroscopy, Vol. 74, Iss. 3, 1998-08 ,pp. : 131-146

Elsevier

Access to resources Recommend Favorite