Quantitative surface microanalysis of samples with extreme topography utilising image interpretation by scatter diagrams and principal component analysis

Author： Barkshire I.R.   Kenny P.G.   Fletcher I.W.   Prutton M.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.63, Iss.3, 1996-07, pp. : 193-203

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