Fine-tuning of the focal residue in exit-wave reconstruction

Author: Tang D.   Zandbergen H.W.   Jansen J.   Op de Beeck M.   Van Dyck D.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.64, Iss.1, 1996-08, pp. : 265-276

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Abstract