Voltage-center and coma-free alignment for high-resolution electron microscopy

By Ishizuka K.   Shirota K.  

Ultramicroscopy, Vol. 62, Iss. 1, 1996-01 ,pp. : 9-13

Elsevier

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Image deconvolution for defected crystals in field-emission high-resolution electron microscopy

By He W.Z.   Li F.H.   Chen H.   Kawasaki K.   Oikawa T.  

Ultramicroscopy, Vol. 70, Iss. 1, 1997-12 ,pp. : 1-11

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High resolution electron microscopy of crystalline polymer wedges

By Wilson P.M.   Martin D.C.  

Ultramicroscopy, Vol. 62, Iss. 4, 1996-03 ,pp. : 215-228

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Implications of high resolution to near-field optical microscopy

By Novotny L.   Hecht B.   Pohl D.W.  

Ultramicroscopy, Vol. 71, Iss. 1, 1998-03 ,pp. : 341-344

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An approach to quantitative high-resolution transmission electron microscopy of crystalline materials

By Kisielowski C.   Schwander P.   Baumann F.H.   Seibt M.   Kim Y.   Ourmazd A.  

Ultramicroscopy, Vol. 58, Iss. 2, 1995-05 ,pp. : 131-155

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