Measurement of the modulation transfer function of a slow-scan CCD camera on a TEM using a thin amorphous film as test signal

By van Zwet E.J.   Zandbergen H.W.  

Ultramicroscopy, Vol. 64, Iss. 1, 1996-08 ,pp. : 49-55

Elsevier

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Performance of a 2k CCD camera designed for electron crystallography at 400kV

By Downing K.H.   Hendrickson F.M.  

Ultramicroscopy, Vol. 75, Iss. 4, 1999-01 ,pp. : 215-233

Elsevier

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Development and performance of a fast fibre-plate coupled CCD camera at medium energy and image processing system for electron holography

By Daberkow I.   Herrmann K.-H.   L. L.   Rau W.D.   Tietz H.  

Ultramicroscopy, Vol. 64, Iss. 1, 1996-08 ,pp. : 35-48

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A method to determine long-range order parameters from electron diffraction intensities detected by a CCD camera

By Kimoto T.   Takeda T.   Shida S.  

Ultramicroscopy, Vol. 96, Iss. 1, 2003-07 ,pp. : 105-116

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The effects of electron and photon scattering on signal and noise transfer properties of scintillators in CCD cameras used for electron detection

By R. Meyer R.   Kirkland A.  

Ultramicroscopy, Vol. 75, Iss. 1, 1998-10 ,pp. : 23-33

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