Measurement of the modulation transfer function of a slow-scan CCD camera on a TEM using a thin amorphous film as test signal

Author： van Zwet E.J.   Zandbergen H.W.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.64, Iss.1, 1996-08, pp. : 49-55

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