Author: Marco S. Chagoyen M. de la Fraga L.G. Carazo J.M. Carrascosa J.L.
Publisher: Elsevier
ISSN: 0304-3991
Source: Ultramicroscopy, Vol.66, Iss.1, 1996-11, pp. : 5-10
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
A marker-free alignment method for electron tomography
By Yu L. Penczek P.A. McEwen B.F. Frank J.
Ultramicroscopy, Vol. 58, Iss. 3, 1995-06 ,pp. :
Alignment of in situ AFM images using microstructured reference points
By Plaschke M. Romer J. Kim J.I.
Ultramicroscopy, Vol. 75, Iss. 2, 1998-11 ,pp. :
Voltage-center and coma-free alignment for high-resolution electron microscopy
Ultramicroscopy, Vol. 62, Iss. 1, 1996-01 ,pp. :