Determination of the orientation of a stacking fault by large-angle convergent-beam electron diffraction (LACBED)

Author： Xiaoli W.   Xiaofeng D.   Shengqiang W.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.66, Iss.1, 1996-11, pp. : 49-57

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